Some Fused Pyrans and Related Compounds. 

المؤلف الرئيسي: Ibrahim, Akram Hassan Mohamed 
التاريخ الميلادي: 2000
الصفحات: 102 
نوع المحتوى: رسائل جامعية
اللغة: الإنجليزية
الدرجة العلمية رسالة دكتوراه
الجامعة Ain Shams university
الدولة مصر
المصدر: غير محدد
الحالة تمت المناقشة
قواعد المعلومات: Thesis
المستخلص: 1- X-ray diffraction patterns XRD were used to study the structure properties of Se80Te15Ge5, Se80Te13Ge7 and Se80Te10Ge10 compositions. 2-Differential thermal analysis DTA was carried out for the as prepared investigated compositions in powder form with
الوصف 1- X-ray diffraction patterns XRD were used to study the structure properties of Se80Te15Ge5, Se80Te13Ge7 and Se80Te10Ge10 compositions. 2-Differential thermal analysis DTA was carried out for the as prepared investigated compositions in powder form with
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خلاصة: 1- X-ray diffraction patterns XRD were used to study the structure properties of Se80Te15Ge5, Se80Te13Ge7 and Se80Te10Ge10 compositions. 2-Differential thermal analysis DTA was carried out for the as prepared investigated compositions in powder form with
الوصف المادي: 102 

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