المؤلف الرئيسي: |
Ibrahim, Akram Hassan Mohamed |
التاريخ الميلادي: |
2000
|
الصفحات: |
102 |
نوع المحتوى: |
رسائل جامعية |
اللغة: |
الإنجليزية
|
الدرجة العلمية |
رسالة دكتوراه |
الجامعة |
Ain Shams university |
الدولة |
مصر |
المصدر: |
غير محدد
|
الحالة |
تمت المناقشة |
قواعد المعلومات: |
Thesis |
المستخلص: |
1- X-ray diffraction patterns XRD were used to study the structure properties of Se80Te15Ge5, Se80Te13Ge7 and Se80Te10Ge10 compositions. 2-Differential thermal analysis DTA was carried out for the as prepared investigated compositions in powder form with |
الوصف |
1- X-ray diffraction patterns XRD were used to study the structure properties of Se80Te15Ge5, Se80Te13Ge7 and Se80Te10Ge10 compositions. 2-Differential thermal analysis DTA was carried out for the as prepared investigated compositions in powder form with |